Sicher im Galvanikprozess.
Using the device versions dresor EL an on-line measurement of deposition thickness and deposition rate is possible. This provide the following advantages for the user:
- Increasing of process reliability in electroless deposition processes
- Replacement of manual probe methods
- Possibility of specific adjustment of the deposition thickness
- Minimizing of over- coating
- Continuous monitoring of the quality critical parameter deposition rate
- Increase of plant throughput
- Early detection of process failures
The dresor EL is particularly suitable for the monitoring of the electroless nickel deposition.
