dresor EL

Measurement in electroless deposition processes

Using the device versions dresor EL an on-line measurement of deposition thickness and deposition rate is possible. This provide the following advantages for the user:

• Increasing of  process reliability in electroless deposition processes
• Replacement of manual probe methods
• Possibility of specific adjustment of the deposition thickness
• Minimizing of over- coating
• Continuous monitoring of the quality critical parameter deposition rate
• Increase of plant throughput
• Early detection of process failures

The dresor EL is particularly suitable for the monitoring of the electroless nickel deposition.